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183

PCB defect detection (6 classes; VOC bbox). Category B, task T-B2, in the unified Smart-Manufacturing SFT schema.

The repository name is an internal task code. See Provenance below for the underlying dataset.

Records

693 records (train=693).

Unified SFT schema

field type meaning
query str the question / instruction (model input)
image Image the input image (bytes embedded)
annot str the answer — for this dataset: one class,[x, y, w, h] line per defect bounding box (COCO x/y/width/height in pixels; converted from the source Pascal-VOC corner boxes). The 6 PCB-defect classes are a closed set given in the query; full boxes + image size are in metadata.objects. Detection task — no mask column — see Task & split below
reasoning null no native CoT in these datasets
cate "B" SFT category
task "T-xx" unified task id
metadata str (JSON) split, provenance, image_path, image_sha256 (dedup key)
mask Image | null (T-B1/T-B2 only) the pixel ground-truth mask, bytes embedded
masks list[Image] (D21 only) multi-region masks

Task & split

What this is. HRIPCB — the Peking University PCB Defect Dataset (Ding et al.): 693 high-resolution printed-circuit-board images organized by defect type into 6 classes (missing_hole, mouse_bite, open_circuit, short, spur, spurious_copper), each annotated with Pascal-VOC bounding boxes (2,953 boxes total; each image holds several boxes of its one defect type). Every image contains defects — no defect-free images.

Task. Object detection: localize and classify every PCB defect. query (our template) names the closed set of 6 classes and asks for one class,[x, y, w, h] line per box (top-left x, y + width, height, in pixels). annot is that — source VOC corner boxes converted to COCO [x,y,w,h]. There is no mask — localization is the bounding box. Full boxes + image size are in metadata.objects; metadata.category records the source folder (the image's defect type).

Split. No upstream train/test split -> single train (693).

Provenance

Underlying dataset: HRIPCB. Upstream license: other (research use; Peking Univ. PCB Defect Dataset) (this card is license: other; respect the upstream terms). Converted read-only from the raw source into the unified schema; conversion script: 183/convert_d83.py, published with publish/push_to_hf.py, both in AI4Manufacturing/forge_model.

Overlap / de-duplication (§8)

None notable. Each record carries metadata.image_sha256 so overlapping images can be kept entirely on one side of a train/eval split.

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